DocumentCode :
688845
Title :
Femtosecond laser desorption of thin polymer films from a dielectric surface
Author :
Mercadier, L. ; Peng, Junbiao ; Sultan, Y. ; Rayner, D.M. ; Corkum, P.B.
Author_Institution :
Nat. Res. Council Lab. for Attosecond Sci., Joint Univ. of Ottawa, Ottawa, ON, Canada
fYear :
2013
fDate :
9-14 June 2013
Firstpage :
1
Lastpage :
2
Abstract :
We desorb polymer films from fused silica with a femtosecond laser and characterize the results by atomic force microscopy. Our study as a function of beam geometry and energy reveals two ways of achieving spatially controlled nanodesorption.
Keywords :
atomic force microscopy; desorption; high-speed optical techniques; laser materials processing; optical polymers; polymer films; silicon compounds; SiO2; atomic force microscopy; beam energy; beam geometry; dielectric surface; femtosecond laser desorption; fused silica; spatially controlled nanodesorption; thin polymer films; Absorption; Laser beams; Measurement by laser beam; Optical surface waves; Silicon compounds; Substrates; Ultrafast optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
Type :
conf
Filename :
6833221
Link To Document :
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