• DocumentCode
    689160
  • Title

    Dual-comb metrology for semiconductor optical frequency comb characterization

  • Author

    Klee, Anthony ; Davila-Rodriguez, J. ; Williams, Chris ; Delfyett, Peter J.

  • Author_Institution
    Coll. of Opt. & Photonics, Univ. of Central Florida, Orlando, FL, USA
  • fYear
    2013
  • fDate
    9-14 June 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Spectrally efficient dual-comb detection is utilized for self-referenced measurements of spectral phase of three distinct semiconductor frequency combs. The higher-order phase is quantified for each, elucidating the dispersive properties of the gain and fiberized cavities.
  • Keywords
    high-speed optical techniques; laser cavity resonators; laser variables measurement; optical fibre dispersion; semiconductor optical amplifiers; dual-comb metrology; fiberized cavities; gain; semiconductor optical frequency comb characterization; spectrally efficient dual-comb detection; Dispersion; Laser mode locking; Optical amplifiers; Optical fiber amplifiers; Semiconductor lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2013 Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    6833542
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=689160