Title :
Dual-comb metrology for semiconductor optical frequency comb characterization
Author :
Klee, Anthony ; Davila-Rodriguez, J. ; Williams, Chris ; Delfyett, Peter J.
Author_Institution :
Coll. of Opt. & Photonics, Univ. of Central Florida, Orlando, FL, USA
Abstract :
Spectrally efficient dual-comb detection is utilized for self-referenced measurements of spectral phase of three distinct semiconductor frequency combs. The higher-order phase is quantified for each, elucidating the dispersive properties of the gain and fiberized cavities.
Keywords :
high-speed optical techniques; laser cavity resonators; laser variables measurement; optical fibre dispersion; semiconductor optical amplifiers; dual-comb metrology; fiberized cavities; gain; semiconductor optical frequency comb characterization; spectrally efficient dual-comb detection; Dispersion; Laser mode locking; Optical amplifiers; Optical fiber amplifiers; Semiconductor lasers;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
