• DocumentCode
    689332
  • Title

    Polarization properties of GaN nanowire lasers

  • Author

    Hurtado, A. ; Xu, Hao ; Wright, J.B. ; Sheng Liu ; Li, Qifeng ; Wang, George T. ; Luk, Ting S. ; Figiel, Jeffery J. ; Cross, Karissa ; Balakrishnan, Ganesh ; Lester, L.F. ; Brener, Igal

  • Author_Institution
    Center for High Technol. Mater., Univ. of New Mexico, Albuquerque, NM, USA
  • fYear
    2013
  • fDate
    9-14 June 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The polarization properties of GaN nanowire lasers are studied experimentally by analyzing their end-facet emission. We demonstrate that the polarization state varies for different transverse modes. Linear and elliptical polarizations are observed in our measurements.
  • Keywords
    III-V semiconductors; gallium compounds; laser modes; laser variables measurement; light polarisation; nanophotonics; nanowires; semiconductor lasers; semiconductor quantum wires; GaN; elliptical polarization properties; end-facet emission analysis; gallium nitride nanowire lasers; linear polarization properties; transverse modes; Gallium nitride; Laser modes; Measurement by laser beam; Optical imaging; Optical polarization; Semiconductor lasers; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2013 Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    6833715