DocumentCode :
689435
Title :
Carrier-envelop phase noise of ultrashort pulses in a Ti:Sapphire amplifier
Author :
Borzsonyi, A. ; Nagymihaly, R.S. ; Jojart, P. ; Osvay, K.
Author_Institution :
Dept. of Opt. & Quantum Electron., Univ. of Szeged, Szeged, Hungary
fYear :
2013
fDate :
9-14 June 2013
Firstpage :
1
Lastpage :
2
Abstract :
The relative carrier-envelop phase (CEP) of pulses are measured at different repetition rates, gain, and saturation levels of a three-pass amplifier, resulting in an increase of <;100mrad CEP noise depending on the amplification conditions.
Keywords :
laser beams; laser noise; phase noise; sapphire; solid lasers; titanium; Al2O3:Ti; CEP noise; Ti:Sapphire amplifier; amplification conditions; carrier-envelop phase noise; gain levels; relative carrier-envelop phase; repetition rates; saturation levels; three-pass amplifier; ultrashort pulses; Cooling; Laser stability; Measurement by laser beam; Noise; Optical interferometry; Optical pulse generation; Pulse measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
Type :
conf
Filename :
6833819
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=689435
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