Title :
Comparing the sensitivity of four laser induced damage tests at 266 nm and 532 nm
Author :
Somoskoi, T. ; Vass, Cs ; Mero, M. ; Mingesz, R. ; Bozoki, Z. ; Osvay, K.
Author_Institution :
Dept. of Opt. & Quantum Electron., Univ. of Szeged, Szeged, Hungary
Abstract :
The techniques of visual inspection, scattered light measurement, and shock wave detection in air and in the sample material have been tested simultaneously on dielectric high reflectors using ns laser pulses.
Keywords :
laser beam effects; laser variables measurement; light scattering; optical testing; shock waves; air; dielectric high reflectors; laser induced damage test sensitivity; laser pulses; sample material; scattered light measurement; shock wave detection; visual inspection techniques; wavelength 266 nm; wavelength 532 nm; Inspection; Measurement by laser beam; Microphones; Probability; Surface emitting lasers; Visualization;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
