DocumentCode :
689513
Title :
Measurement of third-order dispersion in a Hong-Ou-Mandel interferometer
Author :
Quarterman, Adrian ; Carroll, John ; Wonfor, Adrian ; Penty, Richard ; White, Ian
Author_Institution :
Dept. of Eng., Univ. of Cambridge, Cambridge, UK
fYear :
2013
fDate :
9-14 June 2013
Firstpage :
1
Lastpage :
2
Abstract :
The effect of third-order dispersion in a Hong-Ou-Mandel interferometer is investigated using a ZnSe crystal as a dispersive medium. A value for the TOD coefficient of ZnSe is extracted which is consistent with literature values.
Keywords :
II-VI semiconductors; disperse systems; light interferometers; light interferometry; optical dispersion; optical variables measurement; Hong-Ou-Mandel interferometer; ZnSe; dispersive medium; third-order dispersion coefficient measurement; zinc selenide crystal; Crystals; Delays; Optical fiber dispersion; Optical fibers; Optical interferometry; Photonics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
Type :
conf
Filename :
6833899
Link To Document :
بازگشت