DocumentCode
689535
Title
Coherent EUV high harmonic sources for applications in imaging, materials dynamics and nanometrology
Author
Popmintchev, Tenio ; Adams, David ; Seaberg, Matthew ; Nardi, Damiano ; Hoogeboom-Pot, Kathy ; Kapteyn, Henry ; Murnane, Margaret
Author_Institution
JILA, Univ. of Colorado at Boulder, Boulder, CO, USA
fYear
2013
fDate
9-14 June 2013
Firstpage
1
Lastpage
2
Abstract
Coherent high harmonic light sources in the extreme ultraviolet and soft x-ray region are ideally suited for range of nano-imaging, nano-metrologies, and dynamic measurements of materials, thin film and magnetic samples.
Keywords
X-ray optics; light sources; magnetic materials; optical films; optical harmonic generation; optical images; coherent EUV high harmonic sources; dynamic measurements; extreme ultraviolet region; imaging; light sources; magnetic samples; materials dynamics; nano-imaging; nanometrology; soft X-ray region; thin films; Frequency conversion; Harmonic analysis; Magnetic resonance imaging; Materials; Ultrafast optics; Ultraviolet sources;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location
San Jose, CA
Type
conf
Filename
6833921
Link To Document