• DocumentCode
    689626
  • Title

    Measurement of the third order intercept point for a photodiode using two maximum-biased MZM

  • Author

    Shangyuan Li ; Xiaoping Zheng ; Hanyi Zhang ; Bingkun Zhou

  • Author_Institution
    Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
  • fYear
    2013
  • fDate
    9-14 June 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We proposed a simple method to measure the third-order intercept point for a photodiode using two-tone and two maximum-biased MZM. The measured IP3 of 16.04dBm agreed with that measured using traditional three-tone setup.
  • Keywords
    Mach-Zehnder interferometers; nonlinear optical susceptibility; optical modulation; optical variables measurement; photodiodes; IP3; maximum-biased MZM; photodiode; third order intercept point measurement; traditional three-tone setup; two-tone MZM; Frequency measurement; Microwave measurement; Optical fiber communication; Optical variables measurement; Photodiodes; Pollution measurement; Proposals;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2013 Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    6834013
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=689626