Title :
Measurement of attosecond photo-ionization delay in xenon
Author :
Verhoef, A.J. ; Mitrofanov, A. ; Krikunova, M. ; Kabachnik, N.M. ; Drescher, M. ; Baltuska, A.
Author_Institution :
Photonics Inst., Tech. Univ. Wien, Vienna, Austria
Abstract :
We present first results of simultaneous attosecond streaking measurements of shake-up electrons and Auger electrons emitted from xenon. The spectral overlap of the electronic wavepackets allows for reliable reconstruction of the relative phases.
Keywords :
Auger electron spectra; high-speed optical techniques; photoionisation; xenon; Auger electrons; Xe; attosecond photo-ionization delay measurement; electronic wavepackets; relative phases; reliable reconstruction; shake-up electrons; simultaneous attosecond streaking measurement; spectral overlap; Amplitude modulation; Atomic measurements; Delays; Mirrors; Reliability; Spectroscopy; Xenon;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
