Title :
Broadband near-field detection with multi-frequency probe microscopy
Author :
Kohlgraf-Owens, Dana C. ; Greusard, Leo ; Sukhov, Sergey ; De Wilde, Y. ; Dogariu, Aristide
Author_Institution :
CREOL: The Coll. of Opt. & Photonics, Univ. of Central Florida, Orlando, FL, USA
Abstract :
Using scanning probe microscopy with modulated illumination, we demonstrate simultaneous measurement of topography and optical forces exerted on a probe. Broadband optical field detection is possible using a single probe.
Keywords :
optical microscopy; radiation pressure; scanning probe microscopy; broadband near-field detection; multi-frequency probe microscopy; optical forces; scanning probe microscopy; Force; Optical feedback; Optical modulation; Optical scattering; Optical sensors; Optical variables measurement; Probes;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
