Title :
Phonon polariton spectroscopy in the thermal near-field
Author :
O´Callahan, Brian T. ; Jones, Andrew C. ; Raschke, Markus B.
Author_Institution :
Dept. of Phys., Univ. of Colorado, Boulder, CO, USA
Abstract :
Using scattering near-field spectroscopy with heated tips and substrates we characterize the distinct spatial, spectral, and coherence properties of the resonantly enhanced thermal near-field, and the optical antenna mediated projection into far-field emission.
Keywords :
emissivity; infrared spectra; near-field scanning optical microscopy; polaritons; silicon compounds; thermo-optical effects; wide band gap semiconductors; SiC; coherence properties; far-field emission; heated tips; optical antenna mediated projection; phonon polariton spectroscopy; resonantly enhanced thermal near-field; scattering near-field spectroscopy; spatial properties; spectral properties; Microscopy; Optical interferometry; Optical microscopy; Optical scattering; Optical surface waves; Silicon carbide; Tin;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
