Title :
Antenna-mediated near field spectroscopic Imaging: Extension to the time and frequency domains
Author :
Muller, Eric A. ; Bechtel, Hans A. ; Pollard, Bryan ; Olmon, Robert L. ; Martin, Michael C. ; Raschke, Markus B.
Author_Institution :
Dept. of Phys., Univ. of Colorado at Boulder, Boulder, CO, USA
Abstract :
Scattering scanning near field microscopy is capable of measuring the response of a material to incident infrared light with a resolution determined by the tip radius of the antenna. We present new methods and results here, in which broad band and ultrafast sources are used to extend this technique into the time and frequency domains.
Keywords :
antennas; high-speed optical techniques; image resolution; infrared spectra; infrared spectroscopy; light scattering; light sources; near-field scanning optical microscopy; optical images; antenna-mediated near field spectroscopic Imaging; broad band sources; frequency domains; image resolution; incident infrared light; scattering scanning near field microscopy; time domains; ultrafast sources; Antenna measurements; Broadband communication; Frequency-domain analysis; Laser beams; Materials; Spectroscopy; Synchronization;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
