A new trapped mode caused by local defect or thermal inhomogeneity

Author

Peng Li ; Feng Jin

Author_Institution

Sch. of Aerosp., Xi´an Jiaotong Univ., Xian, China

fYear

2013

fDate

25-27 Oct. 2013

Firstpage

1

Lastpage

4

Abstract

The trapped modes, widely used in resonators, filters, quartz crystal microbalance, and other wave devices, are usually excited by attaching a partially mass layer or electrode on the surface of a plate. A new thickness-twist trapped mode in a transversely piezoelectric plate with a defect or local inhomogeneous temperature in it has been obtained by using of power series expansion method. Numerical results obtained indicate that trapped modes exist in such a damaged or thermal plate, which can not be observed when the plate is homogeneous. The finding of energy trapping phenomenon provides a new style for the excitation of trapped waves.

Keywords

defect states; elastic constants; elastic waves; electrodes; filters; piezoelectric materials; plates (structures); quartz crystal microbalances; resonators; damaged plate; electrode; energy trapping phenomenon; filters; local defect; local inhomogeneous temperature; partially mass layer; plate surface; power series expansion method; quartz crystal microbalance; resonators; thermal inhomogeneity; thermal plate; thickness-twist trapped mode; transversely piezoelectric plate; trapped modes; trapped wave excitation; Charge carrier processes; Cutoff frequency; Nonhomogeneous media; Piezoelectricity; Temperature; Vibrations; Energy trapping; Piezoelectric damage; Power series expansion; Thickness-twist waves;

fLanguage

English

Publisher

ieee

Conference_Titel

Piezoelectricity, Acoustic Waves and Device Applications (SPAWDA), 2013 Symposium on

Conference_Location

Changsha

Print_ISBN

978-1-4799-3289-4

Type

conf

DOI

10.1109/SPAWDA.2013.6841113

Filename

6841113