DocumentCode
692518
Title
Iterative and adaptively segmented forward problem based non-blind deconvolution technique for analyzing SRAM margin variation effects
Author
Somha, Worawit ; Yamauchi, Hiroyuki ; Ma Yuyu
Author_Institution
Inf. Intell. Syst., Fukuoka Inst. of Technol. Wajiro-Higashi, Fukuoka, Japan
fYear
2013
fDate
17-19 Nov. 2013
Firstpage
184
Lastpage
187
Abstract
This paper proposes a ringing-error-free non-blind deconvolution technique featuring an iterative and adaptively segmented forward-problem based deconvolution (IASDCN) process. Unlike the algebraic based inverse operations, this eliminates any operations of differential and division by zero to successfully circumvent the issue on an abnormal V-shaped error. This effectiveness has been demonstrated for the first time with applying to a real analysis for the effects of the Random Telegraph Noise (RTN) and/or Random Dopant Fluctuation (RDF) on the overall SRAM margin variations. It has been shown that the proposed IASDCN technique can reduce its relative errors of RTN deconvolution by 1013 to 1015 times, which are good enough for avoiding the abnormal ringing errors in the RTN deconvolution process. This enables to suppress the cdf error of the convolution of RTN with RDF (i.e., fail-bit-count error) to 1/1010 error for the conventional algorithm.
Keywords
SRAM chips; deconvolution; iterative methods; random noise; CDF error; IASDCN process; IASDCN technique; RDF; RTN deconvolution process; SRAM margin variation effect; abnormal V-shaped error; abnormal ringing error; algebraic-based inverse operation; iterative-adaptively-segmented forward problem; nonblind deconvolution technique; overall SRAM margin variation; random dopant fluctuation; random telegraph noise; relative error reduction; ringing-error-free nonblind deconvolution technique; Accuracy; Convolution; Deconvolution; Noise; Optimization; Random access memory; Resource description framework; SRAM; non blind deconvolution; random telegraph noise; time-dependent margin variation;
fLanguage
English
Publisher
ieee
Conference_Titel
SoC Design Conference (ISOCC), 2013 International
Conference_Location
Busan
Type
conf
DOI
10.1109/ISOCC.2013.6863967
Filename
6863967
Link To Document