Title :
Coverage-directed stimulus generation using a genetic algorithm
Author :
Wang Jiawen ; Liu Zhigui ; Wang Suliang ; Liu Yang ; Li Yufei ; Yang Hao
Author_Institution :
China Design Center, IBM Syst. & Technol. Group, Shanghai, China
Abstract :
With the evolution of modern verification methodologies, system-level verification using constrained-random stimulus is a high priority, especially in very large communication applications. A key goal to address is providing fast, effective test coverage. In this paper, we propose a novel method to achieve this goal using a genetic algorithm. First, we present background information about coverage-driven verification methodology, as well as the basic concept and process of the genetic algorithm. Next, we discuss the details of the novel method for integrating this algorithm into a practical verification process. Thereafter, we introduce a simple simulation platform coded in C for benchmarking the proposed method, and present results which illustrate a sharp reduction in the times to complete all coverage bins compared to the traditional test coverage method. Finally, we use a peripheral component interconnect express (PCIE) system as a case study to show the effectiveness of the proposed method in a real application.
Keywords :
circuit optimisation; genetic algorithms; integrated circuit design; integrated circuit testing; system-on-chip; C simulation platform; PCIE system; SoC designs; advanced integrated circuit; constrained-random stimulus; coverage-directed stimulus generation; coverage-driven verification methodology; genetic algorithm; peripheral component interconnect express; system-level verification; system-on-chip designs; test coverage method; Biological cells; Genetic algorithms; Sociology; Standards; Statistics; System-on-chip; Constrained Random Stimulus; Coverage-Driven Verification Methodology; Genetic Algorithm;
Conference_Titel :
SoC Design Conference (ISOCC), 2013 International
Conference_Location :
Busan
DOI :
10.1109/ISOCC.2013.6864032