Title :
An equivalence checking algorithm based on cutset match of gate-level circuits
Author :
Yue Yuan ; Tian Shuangliang
Author_Institution :
Sch. of Math. & Comput. Sci., Northwest Univ. for Nat., Lanzhou, China
Abstract :
In design process of digital circuits, an equivalence checking algorithm is proposed on cut-set match of a gate-level circuit in order to improve the correctness of the circuit design and time and space efficiency of verification. Firstly of all, the specification and implementation circuits are divided into several set-cuts, which are called logic cones in accordance with partition rules. Secondly, cut-sets of two circuits are matched using matching techniques. Thirdly, an “exclusive-or” gate is connected to outputs of the two matched cut-sets, then the miter circuit is constructed, and the structure is changed to the corresponding conjunctive normal formula. Finally, the miter circuit is proven to be functionally equivalent or not by using the engine of SAT. Experimental results show the feasibility of the approach on the ISCAS´85 benchmark circuits.
Keywords :
combinational circuits; computability; formal verification; logic design; logic gates; ISCAS´85 benchmark circuits; circuit design; conjunctive normal formula; cut-set match; digital circuits; equivalence checking algorithm; exclusive-or gate; gate-level circuit; logic cones; matching techniques; miter circuit; partition rules; set-cuts; Algorithm design and analysis; Boolean functions; Circuit synthesis; Data structures; Educational institutions; Integrated circuits; Logic gates; SAT; cut-set; equivalence checking; gate-level circuits; match;
Conference_Titel :
Mechatronic Sciences, Electric Engineering and Computer (MEC), Proceedings 2013 International Conference on
Conference_Location :
Shengyang
Print_ISBN :
978-1-4799-2564-3
DOI :
10.1109/MEC.2013.6885430