Title :
Image analysis pipeline for characterizing photolytic degradation in daguerreotypes
Author :
Yuchuan Zhuang ; Shuo Chen ; Yuan Feng ; Wiegandt, Ralph ; Buckley, Robert ; Sharma, Gitika
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY, USA
Abstract :
We describe an image analysis pipeline for the minimally invasive analysis and characterization of light-induced degradation in daguerreotypes. To our knowledge, this is the first time that quantitative characterization and temporal analysis of the photolytic degradation has been described for daguerreotypes. We measure the impact of degradation using microscopic image capture before and after exposure of a small sacrificial region of the daguerreotype to light. The image analysis pipeline compensates for changes in capture position between the pre and post-exposure images and measures the effects of the degradation in the regions under test. Our results show that photolytic degradation follows a profile that is approximated as the sum of two exponentials with a time constants about 0.41 and 0.003 min-1, with variation across regions.
Keywords :
image processing; photography; daguerreotypes; image analysis pipeline; image processing; light-induced degradation; microscopic image capture; minimally invasive analysis; photographic image; photolytic degradation; post-exposure images; pre-exposure images; Degradation; Light sources; Lighting; Microscopy; Optical microscopy; Pipelines; Reflectivity; SIFT; average intensity; daguerreotypes; image registration; light source; microscope;
Conference_Titel :
Image Processing Workshop (WNYIPW), 2013 IEEE Western New York
Conference_Location :
Rochester, NY
Print_ISBN :
978-1-4799-3025-8
DOI :
10.1109/WNYIPW.2013.6890978