DocumentCode :
69353
Title :
Validation of Power Linearity in Terahertz Time-Domain Spectroscopy Using a Programmable Step Attenuator
Author :
Iida, Hiroyuki ; Kinoshita, Moto ; Shimada, Yusuke ; Kuroda, Hideo ; Kitagishi, Keiko ; Izutani, Y.
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Nat. Metrol. Inst. of Japan, Tsukuba, Japan
Volume :
62
Issue :
6
fYear :
2013
fDate :
Jun-13
Firstpage :
1801
Lastpage :
1806
Abstract :
We have constructed a programmable terahertz step attenuator by stacking metallized-film attenuators (MFAs) of different transmittances. Sputter deposition of Inconel alloy on thin polyester films is used to fabricate the MFAs. Good repeatability and flatness of the step attenuator are confirmed in transmittance measurements by a terahertz time-domain spectroscopy (THz-TDS) system. A method to evaluate the linearity of the THz-TDS system is proposed by using the step attenuator over a wide dynamic range. Calibration curves are analyzed by measuring the transmittance of maltose in different concentrations, and the validity of the proposed method is discussed.
Keywords :
attenuators; calibration; terahertz spectroscopy; calibration curves; inconel alloy; metallized-film attenuators; power linearity; programmable terahertz step attenuator; repeatability; sputter deposition; terahertz time-domain spectroscopy; transmittance measurements; validation; wide dynamic range; Attenuation; Attenuation measurement; Attenuators; Calibration; Dynamic range; Linearity; Metals; Calibration curve; linearity; maltose; metallized film; programmable step attenuator; terahertz time-domain spectroscopy (THz-TDS); validation;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2012.2225927
Filename :
6353925
Link To Document :
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