A Test Procedure for Investigating Hot Spots in Upgraded Metallurgical Grade Silicon (UMG-Si) Photovoltaic (PV) Modules

Author

Bahaidra, Esam S. ; Alamoud, Abdulrahman M.

Author_Institution

Dept. of Electr. Eng., King Saud Univ., Riyadh, Saudi Arabia

fYear

2013

fDate

3-5 Dec. 2013

Firstpage

370

Lastpage

375

Abstract

A study is presented to investigate the effect of hot spot on Upgraded metallurgical grade silicon (UMG-Si) Photovoltaic and on modules. These modules are designed and fabricated based on cells with different breakdown voltage. The procedure of testing is applied to show the performance of modules for the worst case hot spot condition by using outdoor testing and infrared (IR) camera. This test procedure implements international standards of testing PV modules for hot spots with adaptation to the Kingdom of Saudi Arabia (KSA) environment where necessary. The behavior of modules is compared and studied at different situation to know if this type of material is appropriate for photovoltaic applications in the KSA.

Keywords

cameras; electric breakdown; elemental semiconductors; infrared detectors; integrated circuit testing; silicon; solar cells; IR camera; KSA environment; Kingdom of Saudi Arabia environment; UMG-silicon PV; breakdown voltage; infrared camera; international standards; outdoor testing; test procedure; upgraded metallurgical grade silicon photovoltaic modules; worst case hot spot condition; Photovoltaic cells; Photovoltaic systems; Silicon; Sun; Testing; Hot Spots; Infrared; Photovoltaic; UMG-Si;

fLanguage

English

Publisher

ieee

Conference_Titel

Artificial Intelligence, Modelling and Simulation (AIMS), 2013 1st International Conference on

Conference_Location

Kota Kinabalu

Print_ISBN

978-1-4799-3250-4

Type

conf

DOI

10.1109/AIMS.2013.68

Filename

6959946