DocumentCode :
693857
Title :
Detection of Fruit Skin Defects Using Machine Vision System
Author :
Lu Wang ; Anyu Li ; Xin Tian
Author_Institution :
Sch. of Inf. Technol. & Manage., Univ. of Int. Bus. & Econ., Beijing, China
fYear :
2013
fDate :
14-16 Nov. 2013
Firstpage :
44
Lastpage :
48
Abstract :
External appearance is one of the most significant attributes for fruits when consumers decide to choose or reject them, thus packinghouses need to adopt appropriate systems that are capable of detecting the skin defects for fruits before packing them into batches and reaching the end consumers. For this purpose, this paper proposes a new method to detect fruit skin defects by using machine vision system, which is proved to be more accurate, more robust to color noise and has more modest calculation cost. The color histogram is extracted in the local image patch as image feature, while the Linear SVM (Support vector machine) is used for model learning. In a case of orange inspection, this system realizes a recall rate of 96.7% and a false detection rate of 1.7%.
Keywords :
agricultural engineering; agricultural products; computer vision; feature extraction; image colour analysis; inspection; production engineering computing; quality control; support vector machines; color histogram; fruit external appearance; fruit skin defects detection; image extraction; inspection; linear SVM; machine vision system; orange; packing; support vector machine; Colored noise; Histograms; Image color analysis; Machine vision; Skin; Sun; Support vector machines; fruit skin defect detection; machine vision system; support vector machine;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Business Intelligence and Financial Engineering (BIFE), 2013 Sixth International Conference on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-4799-4778-2
Type :
conf
DOI :
10.1109/BIFE.2013.11
Filename :
6961088
Link To Document :
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