• DocumentCode
    69611
  • Title

    An Improved Calculation of Copper Losses in Integrated Power Inductors on Silicon

  • Author

    Ningning Wang ; O´Donnell, Terence ; O´Mathuna, Cian

  • Author_Institution
    Tyndall Nat. Inst., Univ. Coll., Cork, Ireland
  • Volume
    28
  • Issue
    8
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    3641
  • Lastpage
    3647
  • Abstract
    Thin-film Si-integrated inductors with closed cores have different magnetic field distributions in the winding window space compared to the inductors with unclosed cores. One-dimensional methods are no longer applicable for these inductors to calculate the ac resistance. Based on the analysis of the magnetic field distribution of the devices, a 2-D field solution was developed, which leads to an improved 2-D method to calculate the ac resistance of the device. High accuracy of this new approach has been verified by finite-element analysis, while 1-D methods can lead to significant errors.
  • Keywords
    eddy current losses; finite element analysis; magnetic fields; power inductors; thin film devices; 1D methods; 2D field solution; FEA; Si; ac resistance calculation; closed cores; copper losses calculation; finite-element analysis; integrated power inductors; magnetic field distributions; one-dimensional methods; thin-film; unclosed cores; winding window space; Conductors; Finite element methods; Inductors; Magnetic cores; Magnetic fields; Mathematical model; Windings; Conductors; eddy currents; skin effect; thin-film inductors; windings;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2012.2227805
  • Filename
    6353960