DocumentCode :
69611
Title :
An Improved Calculation of Copper Losses in Integrated Power Inductors on Silicon
Author :
Ningning Wang ; O´Donnell, Terence ; O´Mathuna, Cian
Author_Institution :
Tyndall Nat. Inst., Univ. Coll., Cork, Ireland
Volume :
28
Issue :
8
fYear :
2013
fDate :
Aug. 2013
Firstpage :
3641
Lastpage :
3647
Abstract :
Thin-film Si-integrated inductors with closed cores have different magnetic field distributions in the winding window space compared to the inductors with unclosed cores. One-dimensional methods are no longer applicable for these inductors to calculate the ac resistance. Based on the analysis of the magnetic field distribution of the devices, a 2-D field solution was developed, which leads to an improved 2-D method to calculate the ac resistance of the device. High accuracy of this new approach has been verified by finite-element analysis, while 1-D methods can lead to significant errors.
Keywords :
eddy current losses; finite element analysis; magnetic fields; power inductors; thin film devices; 1D methods; 2D field solution; FEA; Si; ac resistance calculation; closed cores; copper losses calculation; finite-element analysis; integrated power inductors; magnetic field distributions; one-dimensional methods; thin-film; unclosed cores; winding window space; Conductors; Finite element methods; Inductors; Magnetic cores; Magnetic fields; Mathematical model; Windings; Conductors; eddy currents; skin effect; thin-film inductors; windings;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2012.2227805
Filename :
6353960
Link To Document :
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