Title :
Could micro patterns be used as software stability indicator?
Author :
Ortu, Marco ; Destefanis, Giuseppe ; Orru, Matteo ; Tonelli, Roberto ; Marchesi, Michele
Author_Institution :
DIEE, Univ. of Cagliari, Cagliari, Italy
Abstract :
Micro patterns can be a useful proxy for the quality of software. Classes matching certain categories of micro patterns were shown to be more fault prone than others, and those classes that do not correspond to any category of micro patterns were shown to be more likely to be faulty. In this paper we present a preliminary study of traditional software metrics and micro patterns in three versions of Eclipse (2.1, 3.0, 3.1) in order to understand if it is possible to relate the stability of a software system with micro patterns.
Keywords :
object-oriented methods; software metrics; software quality; Eclipse; micropatterns; software metrics; software quality; software stability indicator; Catalogs; Java; Pattern matching; Software; Software metrics; Stability analysis;
Conference_Titel :
Patterns Promotion and Anti-patterns Prevention (PPAP), 2015 IEEE 2nd Workshop on
Conference_Location :
Montreal, QC
DOI :
10.1109/PPAP.2015.7076850