• DocumentCode
    697683
  • Title

    Could micro patterns be used as software stability indicator?

  • Author

    Ortu, Marco ; Destefanis, Giuseppe ; Orru, Matteo ; Tonelli, Roberto ; Marchesi, Michele

  • Author_Institution
    DIEE, Univ. of Cagliari, Cagliari, Italy
  • fYear
    2015
  • fDate
    2-2 March 2015
  • Firstpage
    11
  • Lastpage
    12
  • Abstract
    Micro patterns can be a useful proxy for the quality of software. Classes matching certain categories of micro patterns were shown to be more fault prone than others, and those classes that do not correspond to any category of micro patterns were shown to be more likely to be faulty. In this paper we present a preliminary study of traditional software metrics and micro patterns in three versions of Eclipse (2.1, 3.0, 3.1) in order to understand if it is possible to relate the stability of a software system with micro patterns.
  • Keywords
    object-oriented methods; software metrics; software quality; Eclipse; micropatterns; software metrics; software quality; software stability indicator; Catalogs; Java; Pattern matching; Software; Software metrics; Stability analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Patterns Promotion and Anti-patterns Prevention (PPAP), 2015 IEEE 2nd Workshop on
  • Conference_Location
    Montreal, QC
  • Type

    conf

  • DOI
    10.1109/PPAP.2015.7076850
  • Filename
    7076850
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=697683