Title :
Low-complexity method for PAPR reduction in OFDM based on frame expansion parameter selection
Author :
Valbonesi, Lucia ; Ansari, Rashid
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Chicago, Chicago, IL, USA
Abstract :
This paper proposes a low-complexity scheme for PAPR reduction in OFDM based on the Erasure Pattern Selection (EPS) method. EPS has been recently proposed for joint BER and PAPR reduction by using frame expansion in combination with erasures in the OFDM framework. In this paper we discuss the selection of parameters in the EPS method that makes the erasure patterns tight subframes. Based on this selection we develop a low-complexity implementation of the reconstruction algorithm. We compare both complexity and PAPR performance of the proposed scheme with other probabilistic schemes. A key result presented in this paper is that the low-complexity EPS scheme can be effectively combined with existing probabilistic methods to provide improved performance. The combinations have the same complexity of the existing probabilistic methods, but simulation results show a significant improvement in PAPR reduction.
Keywords :
OFDM modulation; error statistics; EPS; OFDM framework; PAPR reduction; erasure pattern selection; frame expansion parameter selection; joint BER; low complexity method; probabilistic schemes; reconstruction algorithm; Bit error rate; Complexity theory; Discrete Fourier transforms; Peak to average power ratio; Probabilistic logic; Vectors;
Conference_Titel :
Signal Processing Conference, 2005 13th European
Conference_Location :
Antalya
Print_ISBN :
978-160-4238-21-1