• DocumentCode
    698970
  • Title

    Debug Challenges for UTMI Low Pin Interface (ULPI) PHY in Nano Scale Technology

  • Author

    Pandey, Maneesh Kumar ; Jain, Neeraj ; Shekhar, Shwetank ; Kumar, Amresh

  • Author_Institution
    Digital Networking Group, Freescale Semicond. India Private Ltd., Noida, India
  • fYear
    2015
  • fDate
    13-14 Feb. 2015
  • Firstpage
    330
  • Lastpage
    333
  • Abstract
    Real world communication are analog in nature whereas data processing happens in digital domain. This leads to generation of Mixed Signal design. With reference to USB, ULPI PHY serves as mixed design component that is present in most of today´s gadgets. Because of its high speed and complexity, there is a need to check the individual design features of the ULPI PHY IP, which are hard to validate when the embedded in a System on Chip. The limitation comes from the fact that only a limited number of signals can be probed at SOC level. This paper describes the debug challenges and techniques used to validate these features before the IP goes into SOC.
  • Keywords
    IP networks; nanoelectronics; system-on-chip; ULPI PHY IP; UTMI PHY low pin interface; nanoscale technology; system on chip; Conferences; Debugging; Receivers; Sensitivity; System-on-chip; Testing; Universal Serial Bus; Low Pin Interface; ULPI; USB; UTMI; nano scale;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence & Communication Technology (CICT), 2015 IEEE International Conference on
  • Conference_Location
    Ghaziabad
  • Print_ISBN
    978-1-4799-6022-4
  • Type

    conf

  • DOI
    10.1109/CICT.2015.83
  • Filename
    7078720