DocumentCode
700373
Title
A framework for cost-effective dependence-based dynamic impact analysis
Author
Haipeng Cai ; Santelices, Raul
Author_Institution
Univ. of Notre Dame, Notre Dame, IN, USA
fYear
2015
fDate
2-6 March 2015
Firstpage
231
Lastpage
240
Abstract
Dynamic impact analysis can greatly assist developers with managing software changes by focusing their attention on the effects of potential changes relative to concrete program executions. While dependence-based dynamic impact analysis (DDIA) provides finer-grained results than traceability-based approaches, traditional DDIA techniques often produce imprecise results, incurring excessive costs thus hindering their adoption in many practical situations. In this paper, we present the design and evaluation of a DDIA framework and its three new instances that offer not only much more precise impact sets but also flexible cost-effectiveness options to meet diverse application needs such as different budgets and levels of detail of results. By exploiting both static dependencies and various dynamic information including method-execution traces, statement coverage, and dynamic points-to data, our techniques achieve that goal at reasonable costs according to our experiment results. Our study also suggests that statement coverage has generally stronger effects on the precision and cost-effectiveness of DDIA than dynamic points-to data.
Keywords
program diagnostics; software cost estimation; software maintenance; DDIA framework; cost-effective dependence-based dynamic impact analysis; dynamic information; dynamic points-to data; flexible cost-effectiveness options; method-execution traces; program execution; software change management; statement coverage; static dependency; Instruments; Java; Monitoring; Optimization; Performance analysis; Runtime; Software; Dependence analysis; cost-effectiveness; dynamic impact analysis; dynamic points-to; statement coverage;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Analysis, Evolution and Reengineering (SANER), 2015 IEEE 22nd International Conference on
Conference_Location
Montreal, QC
Type
conf
DOI
10.1109/SANER.2015.7081833
Filename
7081833
Link To Document