DocumentCode :
700388
Title :
Niche vs. breadth: Calculating expertise over time through a fine-grained analysis
Author :
da Silva, Jose Ricardo ; Clua, Esteban ; Murta, Leonardo ; Sarma, Anita
Author_Institution :
Univ. Fed. Fluminense, Niteroi, Brazil
fYear :
2015
fDate :
2-6 March 2015
Firstpage :
409
Lastpage :
418
Abstract :
Identifying expertise in a project is essential for task allocation, knowledge dissemination, and risk management, among other activities. However, keeping a detailed record of such expertise at class and method levels is cumbersome due to project size, evolution, and team turnover. Existing approaches that automate this task have limitations in terms of the number and granularity of elements that can be analyzed and the analysis timeframe. In this paper, we introduce a novel technique to identify expertise for a given project, package, file, class, or method by considering not only the total number of edits that a developer has made, but also the spread of their changes in an artifact over time, and thereby the breadth of their expertise. We use Dominoes - our GPU-based approach for exploratory repository analysis - for expertise identification over any given granularity and time period with a short processing time. We evaluated our approach through Apache Derby and observed that granularity and time can have significant influence on expertise identification.
Keywords :
data analysis; graphics processing units; information dissemination; project management; relational databases; resource allocation; risk management; software management; Apache Derby; GPU-based approach; expertise identification; exploratory repository analysis; fine-grained analysis; knowledge dissemination; risk management; software project; task allocation; Data mining; Graphics processing units; History; Kernel; Measurement; Standards; GPU computing; expertise identification; exploratory data analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Analysis, Evolution and Reengineering (SANER), 2015 IEEE 22nd International Conference on
Conference_Location :
Montreal, QC
Type :
conf
DOI :
10.1109/SANER.2015.7081851
Filename :
7081851
Link To Document :
بازگشت