• DocumentCode
    70043
  • Title

    A GaN-Based LED With Perpendicular Structure Fabricated on a ZnO Substrate by MOCVD

  • Author

    Yan Lei ; Jia Xu ; Kebao Zhu ; Miao He ; Jun Zhou ; You Gao ; Li Zhang ; Yulong Chen

  • Author_Institution
    Key Lab. of Micro-nano Photonic Functional Mater. & Devices of Guangdong Province, South China Normal Univ., Guangzhou, China
  • Volume
    9
  • Issue
    5
  • fYear
    2013
  • fDate
    May-13
  • Firstpage
    377
  • Lastpage
    381
  • Abstract
    A perpendicular InGaN/GaN multiple-quantum- wells structure on ZnO substrate for blue light emitting diode (LED) was successfully fabricated by use of Metal-organic Chemical Vapor Deposition (MOCVD). During the growing process of GaN-based materials on ZnO substrates, the low-temperature-grown GaN buffer layer, inserted between ZnO substrate and undoped GaN layer, prevented the Zn and O from diffusing from ZnO substrate into the n-GaN layer. This thin GaN buffer layer, mainly as a insulating layer, was grown at relatively low temperature of 530 °C. By using our method, an integrated LED with ZnO substrate can be fabricated with a crack-free GaN film on (0001) ZnO substrate by MOCVD using this method. The epilayer crystalline structure has been measured by atomic force microscopy (AFM), and the optical properties of the LED were also characterized by photoluminescence and Current-Voltage characteristic curve.
  • Keywords
    II-VI semiconductors; III-V semiconductors; MOCVD; atomic force microscopy; gallium compounds; light emitting diodes; photoluminescence; semiconductor quantum wells; wide band gap semiconductors; zinc compounds; AFM; InGaN-GaN; LED optical properties; MOCVD; ZnO; atomic force microscopy; blue LED; blue light emitting diode; crack-free film; current-voltage characteristic curve; epilayer crystalline structure; integrated LED; low-temperature-grown buffer layer; metal-organic chemical vapor deposition; multiple-quantum-well structure; perpendicular structure; photoluminescence; temperature 530 degC; Epitaxial growth; Gallium nitride; Light emitting diodes; MOCVD; Substrates; Zinc oxide; GaN; ZnO; metal-organic chemical vapor deposition (MOCVD); substrate;
  • fLanguage
    English
  • Journal_Title
    Display Technology, Journal of
  • Publisher
    ieee
  • ISSN
    1551-319X
  • Type

    jour

  • DOI
    10.1109/JDT.2012.2236300
  • Filename
    6470704