DocumentCode :
70081
Title :
I V Characteristics of Antiparallel Resistive Switches Observed in a Single
Author :
Liu, Tong ; Verma, Mohini ; Kang, Yuhong ; Orlowski, Marius K.
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Volume :
34
Issue :
1
fYear :
2013
fDate :
Jan. 2013
Firstpage :
108
Lastpage :
110
Abstract :
A Cu/TaOx/Pt resistive cell can transition from a high-resistance state to a low-resistance state by applying positive or negative set voltages. The set operation with positive bias is due to the electrochemical formation of a Cu conductive filament (CF), whereas the set operation with negative bias is attributed to the electroreduction of solid electrolyte and formation of an oxygen vacancy VOCF. Both CFs can be reset by Joule heating. Since set voltages of the VOCF have higher absolute values than those of the Cu CF, the switching based on Cu and VO CFs can be decoupled within the same device. The device is inherently an antiparallel resistive switch circuit that can be consecutively switched between the Cu and VOCFs.
Keywords :
switches; Joule heating; antiparallel resistive switch circuit; antiparallel resistive switches; conductive filament; electrochemical formation; electroreduction; high resistance state; low resistance state; negative bias; negative set voltage; oxygen vacancy; positive set voltage; resistive cell; solid electrolyte; Electrodes; Memristors; Metals; Solids; Switches; Temperature measurement; Voltage measurement; Antiparallel resistive switch (APS); conductive filament (CF); oxygen vacancy;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2012.2222631
Filename :
6355612
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