Title :
Bayesian network for fault diagnosis
Author :
Lo, C.H. ; Wong, Y.K. ; Rad, A.B.
Author_Institution :
Department of Electrical Engineering, The Hong Kong Polytechnic University Hung Hom, Kowloon, Hong Kong
Abstract :
Fault diagnosis based on artificial intelligence techniques often deals with uncertain knowledge and incomplete input data. Probability reasoning is a method to deal with uncertain information, and Bayesian network is a tool that brings it into the real world applications. This paper describes the application of Bayesian network for diagnosing faulty components from engineered systems. A general procedure for constructing the Bayesian network structure on the basis of a bond graph model is proposed. We demonstrate how the resulting Bayesian network can be applied to fault diagnosis in an engineered system.
Keywords :
Bayes methods; Cognition; Computational modeling; Fault diagnosis; Liquids; Mathematical model; Probability distribution; Bayesian networks; Bond graph; Model-based fault diagnosis; Probability reasoning;
Conference_Titel :
European Control Conference (ECC), 2003
Conference_Location :
Cambridge, UK
Print_ISBN :
978-3-9524173-7-9