Title :
Application of the LU Recombination Method to the FETI-DP Method for Solving Low-Frequency Multiscale Electromagnetic Problems
Author :
Wang Yao ; Jian-Ming Jin ; Krein, Philip T.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
The LU recombination method is applied within a dual-primal finite element tearing and interconnecting (FETI-DP) framework to solve low-frequency multiscale electromagnetic problems. The FETI-DP method, a robust domain decomposition method, is adopted to deal with the large-scale linear system resulting from finite element modeling of multiscale problems. When frequency decreases or a highly nonuniform mesh is used, the FETI-DP method encounters a low-frequency breakdown problem. The LU recombination method is adopted to identify and eliminate dependent degrees of freedom (DOFs), so that nearly singular finite element matrices are regularized. Since it deals with matrices directly, the LU recombination method is easily combined with different types and orders of basis functions. A nested scheme is adopted to apply LU recombination within the FETI-DP framework. The proposed algorithm is applied to large-scale eddy-current, switched reluctance motor, and logging-while-drilling tool problems. With the LU recombination method, the FETI-DP method is extended down to DC, making it possible to deal with a variety of problems of practical interest.
Keywords :
eddy currents; electromagnetism; finite element analysis; reluctance motors; FETI-DP framework; FETI-DP method; LU recombination method; dual-primal finite element tearing; finite element modeling; high nonuniform mesh; interconnecting framework; large-scale eddy-current; large-scale linear system; logging-while-drilling tool problems; low-frequency breakdown problem; low-frequency multiscale electromagnetic problems; nested scheme; robust domain decomposition method; singular finite element matrices; switched reluctance motor; Domain decomposition; FETI-DP; LU recombination; low-frequency breakdown;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2013.2264485