Abstract :
The following topics are dealt with: integrated circuit design; CMOS integrated circuits; integrated circuit modeling; nanoelectronics; voltage regulators; BIST; scan testing; SoC; RAM; integrated circuit packaging; hardware security; sensors; EDA; solid-state device; and interconnect technology.
Keywords :
CMOS integrated circuits; built-in self test; electronic design automation; integrated circuit design; integrated circuit modelling; integrated circuit packaging; interconnections; nanoelectronics; random-access storage; sensors; system-on-chip; voltage regulators; BIST; CMOS integrated circuits; EDA; RAM; SoC; hardware security; integrated circuit design; integrated circuit modeling; integrated circuit packaging; interconnect technology; nanoelectronics; scan testing; sensors; solid-state device; voltage regulators;
Conference_Titel :
Quality Electronic Design (ISQED), 2015 16th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-7580-8
DOI :
10.1109/ISQED.2015.7085357
