• DocumentCode
    702271
  • Title

    Energy reduction by built-in body biasing with single supply voltage operation

  • Author

    Kamae, Norihiro ; Mahfuzul Islam, A.K.M. ; Tsuchiya, Akira ; Ishihara, Tohru ; Onodera, Hidetoshi

  • Author_Institution
    Dept. of Commun. & Comput. Eng., Kyoto Univ., Kyoto, Japan
  • fYear
    2015
  • fDate
    2-4 March 2015
  • Firstpage
    181
  • Lastpage
    185
  • Abstract
    Energy-efficiency has become the driving force of today´s LSI industry. In order to achieve minimum energy operation of LSI, we propose a built-in body biasing technique which generates independent body biases for nMOSFET and pMOSFET separately. We design and fabricate an application circuit integrated with our proposed built-in body bias generation (BBG) circuits in a 65-nm process. The application circuit consists of AES cipher and decipher modules. The BBG does not require an external supply and it is compatible with a dynamic voltage scaling scheme for the application circuit. Cell-based design of the BBG circuit has been applied to facilitate automatic place and route. Both of the AES and the BBG circuits have been routed simultaneously to reduce design and area overhead. In post-silicon, supply voltage and body bias voltages are selected to achieve the minimum energy consumption for a target frequency. From the measurement results, more than 20% of energy reduction is achieved compared with adjusting supply voltage alone.
  • Keywords
    MOSFET circuits; energy conservation; integrated circuit design; large scale integration; AES cipher modules; BBG circuits; LSI industry; application circuit; area overhead reduction; built-in body bias generation circuits; built-in body biasing technique; cell-based design; decipher modules; dynamic voltage scaling scheme; energy reduction; energy-efficiency; independent body biases; minimum energy consumption; nMOSFET; pMOSFET; post-silicon; single supply voltage operation; size 65 nm; Ciphers; Delays; Energy consumption; Integrated circuit modeling; MOSFET circuits; System-on-chip; Threshold voltage; Body biasing; adaptive body biasing; energy-per-cycle reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2015 16th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-7580-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2015.7085421
  • Filename
    7085421