Title :
Trading-off system load and communication in mapping heuristics for improving NoC-based MPSoCs reliability
Author :
Mandelli, Marcelo ; Ost, Luciano ; Sassatelli, Gilles ; Moraes, Fernando
Author_Institution :
FACIN - PUCRS, Porto Alegre, Brazil
Abstract :
Improving embedded systems lifetime and reliability become a major concern for the semiconductor industry. Imbalanced mapping of applications may considerably impact on system lifetime since processors and NoC links located in hotspot zones may age faster than others, compromising the overall system performance. This work proposes a dynamic mapping heuristic that makes a trade-off between processors´ load and NoC communication volume, aiming to increase system reliability. Results show the proposed heuristic provides a well-balanced workload distribution while reducing communication volume. Results showed that proposed mapping reduces application execution time (average 10%) and hotspots zones when compared to conventional mapping approaches.
Keywords :
integrated circuit reliability; multiprocessing systems; system-on-chip; NoC-based MPSoC reliability; dynamic mapping heuristic; hotspots zones; semiconductor industry; system reliability; trading-off system load; workload distribution; Decoding; Processor scheduling; Program processors; Reliability; Runtime; Standards; Transform coding; MPSoC; NoC; dynamic mapping; lifetime; reliability;
Conference_Titel :
Quality Electronic Design (ISQED), 2015 16th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-7580-8
DOI :
10.1109/ISQED.2015.7085457