• DocumentCode
    702301
  • Title

    Crosstalk-aware signal probability-based dynamic statistical timing analysis

  • Author

    Yao Chen ; Kahng, Andrew B. ; Bao Liu ; Wenjun Wang

  • Author_Institution
    Univ. of Texas at San Antonio, San Antonio, TX, USA
  • fYear
    2015
  • fDate
    2-4 March 2015
  • Firstpage
    424
  • Lastpage
    429
  • Abstract
    Crosstalk is an increasingly significant effect for VLSI timing performance. Traditional STA or SSTA techniques provide pessimistic crosstalk analysis based on timing window envelopes. In this paper, we present input-aware signal probability-based statistical timing analysis (SPSTA) taking crosstalk-induced delay variations into account. SPSTA achieves reduced pessimism and improved accuracy by signal propagation path/network-based timing analysis and leveraging some existing automatic test pattern generation (ATPG) techniques. Our experiments based on the 45nm Nangate open cell library show that compared with 1.35 million Monte Carlo simulation runs, while PrimeTime-SI over-estimates by 14.64%, 16.39% and 19.69%, SSTA achieves an average of 2.85%, 2.89% and 3.59% inaccuracy, and SPSTA achieves an average of 1.85%, 2.54% and 1.53% inaccuracy in crosstalk-oblivious, crosstalk-aware non-iterative and crosstalk-aware iterative analysis, respectively.
  • Keywords
    VLSI; automatic test pattern generation; crosstalk; iterative methods; statistical analysis; timing; ATPG techniques; Nangate open cell library show; SPSTA; SSTA techniques; VLSI timing performance; automatic test pattern generation techniques; crosstalk-aware iterative analysis; crosstalk-aware non-iterative analysis; crosstalk-induced delay variations; crosstalk-oblivious analysis; input-aware signal probability-based statistical timing analysis; network-based timing analysis; pessimistic crosstalk analysis; signal propagation path; size 45 nm; timing window envelopes; Crosstalk; Delays; Logic gates; Monte Carlo methods; Probability; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2015 16th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-7580-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2015.7085463
  • Filename
    7085463