DocumentCode :
702633
Title :
Test bed for low-cost measurement of AM/AM and AM/PM effects in RF PAs based on FPGA
Author :
Nunez-Perez, J.C. ; Cardenas-Valdez, J.R. ; Gontrand, C. ; Jauregui-Duran, R. ; Reynoso-Hernandez, J.A.
Author_Institution :
Res. Center & Dev. of Digital Technol., Nat. Polytech. Inst., Tijuana, Mexico
fYear :
2015
fDate :
25-27 Feb. 2015
Firstpage :
87
Lastpage :
92
Abstract :
This work presents a new proposal FPGA-based for low cost measurement of AM/AM and AM-PM distortion curves in RF Power Amplifiers through DSP Builder tool into a Development Board. A practical comparison between state-of-the-art reported works based on measurements of AM/AM and AM-PM distortion curves is discussed, in terms of low cost measurement, by using a FPGA development board and a PC to obtain the PA distortion curves adding flexibility to read the PA behavior. The main contribution is the full control of the digital PA behavior based on the phase to amplitude conversion principle simulated in Matlab-Simulink. This test bed is able to recalculate the known AM/AM and AM/PM measurements stored as LUT in a previous development board but also a real PA as DUT can be added.
Keywords :
distortion; field programmable gate arrays; power amplifiers; radiofrequency amplifiers; AM-AM effects; AM-PM distortion curves; AM-PM effects; DSP Builder tool; DUT; FPGA; LUT; Matlab-Simulink; RF PAs test bed; RF power amplifiers; development board; digital PA behavior; low-cost measurement; phase to amplitude conversion principle; Digital signal processing; Distortion measurement; Field programmable gate arrays; Measurement techniques; Nonlinear distortion; Phase distortion; Phase measurement; AM-AM; AM-PM; FPGA; Power Amplifier; behavioral models; development boards; test bed;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Communications and Computers (CONIELECOMP), 2015 International Conference on
Conference_Location :
Cholula
Type :
conf
DOI :
10.1109/CONIELECOMP.2015.7086930
Filename :
7086930
Link To Document :
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