Title :
Silicon proof of the intelligent analog IP design flow for flexible automotive components
Author :
Reich, T. ; Prautsch, H.D.B. ; Eichler, U. ; Buhl, R.
Author_Institution :
Design Autom. Div., Fraunhofer Inst. for Integrated Circuits, Dresden, Germany
Abstract :
In this brief paper we present the successful silicon validation of the Intelligent Analog IP (IIP) design flow applied to the design of a SMART sensor IC for automotive requirements. Using a library of reconfigurable and robust analog IP we fast create parameterized cells up to high complexity levels including the corresponding layouts. This allows us (1) to overcome time-consuming handcrafted analog re-design cycles, (2) to include the effects of layout parasitics into the optimization loop, and thus (3) to fast achieve different specifications even for multiple technologies. We show that the IIP design flow leads to a strong improvement of design efficiency, silicon performance, and yield.
Keywords :
analogue circuits; automotive electronics; circuit optimisation; elemental semiconductors; integrated circuit design; intelligent sensors; silicon; IIP design flow; Si; flexible automotive components; intelligent analog IP design flow; layout parasitics; parameterized cells; silicon proof; smart sensor IC; time-consuming handcrafted analog redesign cycles; IP networks; Integrated circuits; Layout; Libraries; Optimization; Silicon; Topology; Design Flow; Intelligent IP; Optimization; Post-Layout; Reuse; Yield;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location :
Grenoble
Print_ISBN :
978-3-9815-3704-8