• DocumentCode
    703885
  • Title

    Adaptively tolerate power-gating-induced power/ground noise under process variations

  • Author

    Zhe Wang ; Xuan Wang ; Jiang Xu ; Xiaowen Wu ; Zhehui Wang ; Peng Yang ; Duong, Luan H. K. ; Haoran Li ; Maeda, Rafael K. V. ; Zhifei Wang

  • Author_Institution
    Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • fYear
    2015
  • fDate
    9-13 March 2015
  • Firstpage
    483
  • Lastpage
    488
  • Abstract
    Power gating is one of the most effective techniques to reduce the leakage power in multiprocessor system-on-chips (MPSoCs). However, the power-mode transition during the power gating period of an individual processing unit will introduce serious power/ground (P/G) noise to the neighboring processing units. As technology scales, the P/G noise problem becomes a severe reliability threat to MPSoCs. At the same time, the increasing manufacturing process variations also bring uncertainties to the P/G noise problem and make it difficult to predict and deal with. In order to address this problem, for the first time, this paper analyzes the power-gating-induced P/G noise in the presence of process variations, and proposes a hardware-software collaborated online method to adaptively protect processing units from P/G noise. Sensor network-on-chip (SENoC) is used to gather noise information and coordinate different system components. Meanwhile an online software-based algorithm is developed to effectively decide the noise impact range and arrange protections for affected processing units based on the collected information. We evaluate the proposed method through Monte Carlo simulations on a NoC-based MPSoC platform. The experimental results show that for a set of real applications, our method achieves on average 13.2% overall performance improvement and 13.3% system energy reduction compared with the traditional stop-go method.
  • Keywords
    Monte Carlo methods; electric sensing devices; integrated circuit reliability; network-on-chip; Monte Carlo simulations; NoC-based MPSoC platform; P-G noise problem; SENoC; adaptively tolerate power-gating-induced power-ground noise information; hardware-software collaborated online method; individual processing unit protection; leakage power reduction; manufacturing process variations; multiprocessor system-on-chips; neighboring processing units; noise impact range; online software-based algorithm; performance improvement; power-mode transition; process variations; reliability threat; sensor network-on-chip; stop-go method; system energy reduction; technology scales; Manufacturing processes; Noise; Switching circuits; System-on-chip; Transistors; Voltage measurement; Wires; Multiprocessor system-on-chip; power gating; process variation; reliability; sensor network-on-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
  • Conference_Location
    Grenoble
  • Print_ISBN
    978-3-9815-3704-8
  • Type

    conf

  • Filename
    7092437