DocumentCode :
703885
Title :
Adaptively tolerate power-gating-induced power/ground noise under process variations
Author :
Zhe Wang ; Xuan Wang ; Jiang Xu ; Xiaowen Wu ; Zhehui Wang ; Peng Yang ; Duong, Luan H. K. ; Haoran Li ; Maeda, Rafael K. V. ; Zhifei Wang
Author_Institution :
Hong Kong Univ. of Sci. & Technol., Hong Kong, China
fYear :
2015
fDate :
9-13 March 2015
Firstpage :
483
Lastpage :
488
Abstract :
Power gating is one of the most effective techniques to reduce the leakage power in multiprocessor system-on-chips (MPSoCs). However, the power-mode transition during the power gating period of an individual processing unit will introduce serious power/ground (P/G) noise to the neighboring processing units. As technology scales, the P/G noise problem becomes a severe reliability threat to MPSoCs. At the same time, the increasing manufacturing process variations also bring uncertainties to the P/G noise problem and make it difficult to predict and deal with. In order to address this problem, for the first time, this paper analyzes the power-gating-induced P/G noise in the presence of process variations, and proposes a hardware-software collaborated online method to adaptively protect processing units from P/G noise. Sensor network-on-chip (SENoC) is used to gather noise information and coordinate different system components. Meanwhile an online software-based algorithm is developed to effectively decide the noise impact range and arrange protections for affected processing units based on the collected information. We evaluate the proposed method through Monte Carlo simulations on a NoC-based MPSoC platform. The experimental results show that for a set of real applications, our method achieves on average 13.2% overall performance improvement and 13.3% system energy reduction compared with the traditional stop-go method.
Keywords :
Monte Carlo methods; electric sensing devices; integrated circuit reliability; network-on-chip; Monte Carlo simulations; NoC-based MPSoC platform; P-G noise problem; SENoC; adaptively tolerate power-gating-induced power-ground noise information; hardware-software collaborated online method; individual processing unit protection; leakage power reduction; manufacturing process variations; multiprocessor system-on-chips; neighboring processing units; noise impact range; online software-based algorithm; performance improvement; power-mode transition; process variations; reliability threat; sensor network-on-chip; stop-go method; system energy reduction; technology scales; Manufacturing processes; Noise; Switching circuits; System-on-chip; Transistors; Voltage measurement; Wires; Multiprocessor system-on-chip; power gating; process variation; reliability; sensor network-on-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location :
Grenoble
Print_ISBN :
978-3-9815-3704-8
Type :
conf
Filename :
7092437
Link To Document :
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