Title :
Coherent crosstalk noise analyses in ring-based optical interconnects
Author :
Duong, Luan H. K. ; Nikdast, Mahdi ; Jiang Xu ; Zhehui Wang ; Thonnart, Yvain ; Le Beux, Sebastien ; Peng Yang ; Xiaowen Wu ; Zhifei Wang
Abstract :
Recently, optical interconnects have been proposed for ultra-high bandwidth and low latency inter/intra-chip communication in multiprocessor systems-on-chip (MPSoCs). These optical interconnects employ the microresonators (MRs) to direct/detect the optical signal. However, utilized MRs suffer from intrinsic crosstalk noise and power loss, degrading the network efficiency via the signal-to-noise ratio (SNR). In this paper, both coherent and incoherent crosstalk in wavelength-division multiplexing (WDM) networks are discussed and systematically analyzed. We carefully develop our analytical models at the optical-circuit level, and apply them to two ring-based networks: SUOR and Corona ONoCs. The quantitative results have demonstrated that the architectural design of the ONoCs determines the impact of crosstalk on the SNR. Even though SUOR and Corona are both ring-based ONoCs, the worst-case SNR can be differed up to 50dB. Our analyses of the worst-case SNR can be utilized as a platform to compare the realistic performance among different optical interconnection networks via the degradation of BER and data bandwidth.
Keywords :
error statistics; integrated circuit noise; microcavities; micromechanical resonators; optical crosstalk; optical interconnections; system-on-chip; wavelength division multiplexing; BER degradation; Corona ONoC; MPSoC; MR; SNR; SUOR; WDM network; bit error rate; coherent crosstalk noise analysis; incoherent crosstalk; interchip communication; intrachip communication; intrinsic crosstalk noise; microresonator; multiprocessor systems-on-chip; optical signal; optical-circuit level; power loss; ring-based optical interconnect; signal-to-noise ratio; ultrahigh bandwidth; wavelength-division multiplexing; Corona; Crosstalk; Detectors; Optical crosstalk; Optical interconnections; Optical waveguides; Signal to noise ratio;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location :
Grenoble
Print_ISBN :
978-3-9815-3704-8