DocumentCode :
703942
Title :
Mixed wire and surface-wave communication fabrics for decentralized on-chip multicasting
Author :
Karkar, Ammar ; Kin-Fai Tong ; Mak, Terrence ; Yakovlev, Alex
Author_Institution :
Sch. of Electr. & Electron. Eng., Newcastle Univ., Newcastle upon Tyne, UK
fYear :
2015
fDate :
9-13 March 2015
Firstpage :
794
Lastpage :
799
Abstract :
Network-on-chip (NoC) has emerged to tackle different on-chip challenges and has satisfied different demands in terms of high performance, economical and reliable interconnect implementation. However, a merely metal-based interconnect reaches performance bound with the relentless technology scaling. Especially, it displayed a bottleneck to meet the communication bandwidth demand for multicasting. This paper proposes a novel hybrid architecture, which improves the on-chip communication bandwidth significantly using mixed wires and surface wave interconnects (SWI) fabrics. In particular, the bandwidth of multicasting can be drastically improved. We introduce a decentralized arbitration method to fully utilize the slack-time scheduling with deadlock-free flow control. Evaluation results, based on a cycle-accurate and hardware-based simulation, demonstrate the effectiveness of the proposed architecture and methods. Compared to a wire-based NoC, the mixed fabric approach can achieve an improvement in power reduction and communication speed up to 63% and 12X, respectively. These results are achieved with almost negligible hardware overheads. This new paradigm efficiently addresses the emerged challenges for on-chip communications.
Keywords :
fabrics; integrated circuit interconnections; network-on-chip; scheduling; NoC; SWI fabric; communication speed; deadlock-free flow control; decentralized arbitration method; decentralized on-chip multicasting; hybrid architecture; metal-based interconnect; mixed wire fabric; network-on-chip; on-chip communication bandwidth; power reduction; slack-time scheduling; surface wave interconnect; surface-wave communication fabric; technology scaling; Fabrics; Integrated circuit interconnections; Power demand; Protocols; Surface impedance; Surface waves; System-on-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location :
Grenoble
Print_ISBN :
978-3-9815-3704-8
Type :
conf
Filename :
7092494
Link To Document :
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