Title :
Spiking neural network with RRAM: Can we use it for real-world application?
Author :
Tianqi Tang ; Lixue Xia ; Boxun Li ; Rong Luo ; Yiran Chen ; Yu Wang ; Huazhong Yang
Author_Institution :
Dept. of E.E., Tsinghua Univ., Beijing, China
Abstract :
The spiking neural network (SNN) provides a promising solution to drastically promote the performance and efficiency of computing systems. Previous work of SNN mainly focus on increasing the scalability and level of realism in a neural simulation, while few of them support practical cognitive applications with acceptable performance. At the same time, based on the traditional CMOS technology, the efficiency of SNN systems is also unsatisfactory. In this work, we explore different training algorithms of SNN for real-world applications, and demonstrate that the Neural Sampling method is much more effective than Spiking Time Dependent Plasticity (STDP) and Remote Supervision Method (ReSuMe). We also propose an energy efficient implementation of SNN with the emerging metal-oxide resistive random access memory (RRAM) devices, which includes an RRAM crossbar array works as network synapses, an analog design of the spike neuron, and an input encoding scheme. A parameter mapping algorithm is also introduced to configure the RRAM-based SNN. Simulation results illustrate that the system achieves 91.2% accuracy on the MNIST dataset with an ultra-low power consumption of 3.5mW. Moreover, the RRAM-based SNN system demonstrates great robustness to 20% process variation with less than 1% accuracy decrease, and can tolerate 20% signal fluctuation with about 2% accuracy loss. These results reveal that the RRAM-based SNN will be quite easy to be physically realized.
Keywords :
learning (artificial intelligence); neural nets; performance evaluation; random-access storage; CMOS technology; RRAM crossbar array; RRAM-based SNN system; SNN training algorithms; analog spike neuron design; computing system efficiency; computing system performance; input encoding scheme; metal-oxide resistive random access memory devices; network synapses; neural sampling method; parameter mapping algorithm; process variation; signal fluctuation; spiking neural network; Accuracy; Algorithm design and analysis; Arrays; Biological neural networks; Neurons; Training;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location :
Grenoble
Print_ISBN :
978-3-9815-3704-8