DocumentCode :
703970
Title :
An energy-efficient non-volatile in-memory accelerator for sparse-representation based face recognition
Author :
Yuhao Wang ; Hantao Huang ; Leibin Ni ; Hao Yu ; Mei Yan ; Chuliang Weng ; Wei Yang ; Junfeng Zhao
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2015
fDate :
9-13 March 2015
Firstpage :
932
Lastpage :
935
Abstract :
Data analytics such as face recognition involves large volume of image data, and hence leads to grand challenge on mobile platform design with strict power requirement. Emerging non-volatile STT-MRAM has the minimum leakage power and comparable speed to SRAM, and hence is considered as a promising candidate for data-oriented mobile computing. However, there exists significantly higher write-energy for STT-MRAM when compared to the SRAM. Based on the use of STT-MRAM, this paper introduces an energy-efficient non-volatile in-memory accelerator for a sparse-representation based face recognition algorithm. We find that by projecting high-dimension image data to much lower dimension, the current scaling for STT-MRAM write operation can be applied aggressively, which leads to significant power reduction yet maintains quality-of-service for face recognition. Specifically, compared to a baseline with SRAM, leakage power and dynamic power are reduced by 91.4% and 79% respectively with only slight compromise on recognition rate.
Keywords :
MRAM devices; SRAM chips; energy conservation; face recognition; image representation; power aware computing; quality of service; STT-MRAM write operation; dynamic power; energy-efficient nonvolatile in-memory accelerator; leakage power; power reduction; quality-of-service; sparse-representation based face recognition; spin-toque-transfer magnetic random access memory; Computer architecture; Databases; Face recognition; Feature extraction; Nonvolatile memory; Quality of service; Random access memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location :
Grenoble
Print_ISBN :
978-3-9815-3704-8
Type :
conf
Filename :
7092522
Link To Document :
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