Title :
Efficient bit error rate estimation for high-speed link by Bayesian model fusion
Author :
Chenlei Fang ; Qicheng Huang ; Fan Yang ; Xuan Zeng ; Xin Li ; Chenjie Gu
Author_Institution :
Microelectron. Dept., Fudan Univ., Shanghai, China
Abstract :
High-speed I/O link is an important component in computer systems, and estimating its bit error rate (BER) is a critical task to guarantee its performance. In this paper, we propose an efficient method to estimate BER by Bayesian Model Fusion. Its key idea is to borrow conventional extrapolated BER value as prior knowledge, and combine it with additional measurement data to “calibrate” the BER value. This method can be viewed as an application of Bayesian Model Fusion (BMF) technique. We further propose some novel methodologies to make BMF applicable in the BER estimation case. In this way, we can sufficiently decrease the number of bits needed to estimate BER value. Several experiments demonstrate that our proposed method achieves up to 8× speed-up over direct estimation method.
Keywords :
Bayes methods; error statistics; extrapolation; input-output programs; sensor fusion; BER extrapolation value; BER value calibration; Bayesian model fusion; efficient bit error rate estimation; high-speed I-O link; measurement data; Bayes methods; Bit error rate; Extrapolation; Maximum likelihood estimation; Time measurement; Voltage measurement;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location :
Grenoble
Print_ISBN :
978-3-9815-3704-8