DocumentCode
704026
Title
Reuse distance analysis for locality optimization in loop-dominated applications
Author
Lezos, Christakis ; Dimitroulakos, Grigoris ; Masselos, Konstantinos
Author_Institution
Dept. of Inf. & Telecommun., Univ. of Peloponnese, Tripoli, Greece
fYear
2015
fDate
9-13 March 2015
Firstpage
1237
Lastpage
1240
Abstract
This paper discusses MemAddIn, a compiler assisted dynamic code analysis tool that analyzes C code and exposes critical parts for memory related optimizations on embedded systems that can heavily affect systems performance, power and cost. The tool includes enhanced features for data reuse distance analysis and source code transformation recommendations for temporal locality optimization. Several of data reuse distance measurement algorithms have been implemented leading to different trade-offs between accuracy and profiling execution time. The proposed tool can be easily and seamlessly integrated into different software development environments offering a unified environment for application development and optimization. The novelties of our work over a similar optimization tool are also discussed. MemAddIn has been applied for the dynamic computation of data reuse distance for a number of different applications. Experimental results prove the effectiveness of the tool through the analysis and optimization of a realistic image processing application.
Keywords
embedded systems; image processing; optimisation; program compilers; program diagnostics; software reusability; source code (software); C code; MemAddIn; compiler assisted dynamic code analysis tool; data reuse distance analysis; data reuse distance measurement algorithms; embedded systems; locality optimization; loop-dominated applications; memory related optimizations; optimization; profiling execution time; realistic image processing application; software development environments; source code transformation recommendations; temporal locality optimization; Algorithm design and analysis; Arrays; Distance measurement; Histograms; Optimization; Random access memory; Data reuse distance analysis; locality optimization; memory hierarchy optimization;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location
Grenoble
Print_ISBN
978-3-9815-3704-8
Type
conf
Filename
7092578
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