DocumentCode
704088
Title
May-happen-in-parallel analysis of ESL models using UPPAAL model checking
Author
Che-Wei Chang ; Domer, Rainer
Author_Institution
Center for Embedded Comput. Syst., Univ. of California, Irvine, Irvine, CA, USA
fYear
2015
fDate
9-13 March 2015
Firstpage
1567
Lastpage
1570
Abstract
In this paper, we propose an approach for May-Happen-in-Parallel (MHP) analysis of electronic system level (ESL) design which models parallel discrete event simulation with concurrent automaton processes and formally identify those MHP states. Our MHP analysis utilizes formal verification by use of the UPPAAL model checker. The proposed approach converts the system model in SpecC SLDL into an UPPAAL model and generates a set of queries that automatically and completely finds all possible MHP pairs. The experimental results show our approach can report more precise MHP analysis results compared to other works at the cost of extended analysis run time.
Keywords
discrete event simulation; electronic engineering computing; formal verification; parallel processing; ESL model; MHP analysis; SpecC SLDL; UPPAAL model checker; UPPAAL model checking; concurrent automaton process; electronic system level design; formal verification; may-happen-in-parallel analysis; parallel discrete event simulation; Analytical models; Automata; Computational modeling; Generators; Optimization; Semantics; Transform coding;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location
Grenoble
Print_ISBN
978-3-9815-3704-8
Type
conf
Filename
7092640
Link To Document