• DocumentCode
    704088
  • Title

    May-happen-in-parallel analysis of ESL models using UPPAAL model checking

  • Author

    Che-Wei Chang ; Domer, Rainer

  • Author_Institution
    Center for Embedded Comput. Syst., Univ. of California, Irvine, Irvine, CA, USA
  • fYear
    2015
  • fDate
    9-13 March 2015
  • Firstpage
    1567
  • Lastpage
    1570
  • Abstract
    In this paper, we propose an approach for May-Happen-in-Parallel (MHP) analysis of electronic system level (ESL) design which models parallel discrete event simulation with concurrent automaton processes and formally identify those MHP states. Our MHP analysis utilizes formal verification by use of the UPPAAL model checker. The proposed approach converts the system model in SpecC SLDL into an UPPAAL model and generates a set of queries that automatically and completely finds all possible MHP pairs. The experimental results show our approach can report more precise MHP analysis results compared to other works at the cost of extended analysis run time.
  • Keywords
    discrete event simulation; electronic engineering computing; formal verification; parallel processing; ESL model; MHP analysis; SpecC SLDL; UPPAAL model checker; UPPAAL model checking; concurrent automaton process; electronic system level design; formal verification; may-happen-in-parallel analysis; parallel discrete event simulation; Analytical models; Automata; Computational modeling; Generators; Optimization; Semantics; Transform coding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
  • Conference_Location
    Grenoble
  • Print_ISBN
    978-3-9815-3704-8
  • Type

    conf

  • Filename
    7092640