DocumentCode :
704105
Title :
Simultaneous transistor pairing and placement for CMOS standard cells
Author :
Ang Lu ; Hsueh-Ju Lu ; En-Jang Jang ; Yu-Po Lin ; Chun-Hsiang Hung ; Chun-Chih Chuang ; Rung-Bin Lin
Author_Institution :
Comput. Sci. & Eng., Yuan Ze Univ., Chungli, Taiwan
fYear :
2015
fDate :
9-13 March 2015
Firstpage :
1647
Lastpage :
1652
Abstract :
This paper presents an integer linear programming approach to transistor placement problem for CMOS standard cells with objectives of minimizing cell width, wiring density, wiring length, diffusion contour roughness, and misalignments of common ploy gates. Our approach considers transistor pairing and transistor placement simultaneously. It can achieve a smaller number of transistor chains than the well-known bipartite approach. About 31% of the 185 cells created by it have smaller widths and no cells whose widths are larger than their handcrafted counterparts.
Keywords :
CMOS integrated circuits; integer programming; linear programming; transistor circuits; CMOS standard cells; bipartite approach; common ploy gates misalignments; diffusion contour roughness; integer linear programming; transistor pairing; transistor placement; wiring density; wiring length; Layout; Logic gates; Runtime; Standards; Transistors; Wires; Wiring; Transistor placement; standard cell; transistor folding; transistor pairing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location :
Grenoble
Print_ISBN :
978-3-9815-3704-8
Type :
conf
Filename :
7092657
Link To Document :
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