• DocumentCode
    704105
  • Title

    Simultaneous transistor pairing and placement for CMOS standard cells

  • Author

    Ang Lu ; Hsueh-Ju Lu ; En-Jang Jang ; Yu-Po Lin ; Chun-Hsiang Hung ; Chun-Chih Chuang ; Rung-Bin Lin

  • Author_Institution
    Comput. Sci. & Eng., Yuan Ze Univ., Chungli, Taiwan
  • fYear
    2015
  • fDate
    9-13 March 2015
  • Firstpage
    1647
  • Lastpage
    1652
  • Abstract
    This paper presents an integer linear programming approach to transistor placement problem for CMOS standard cells with objectives of minimizing cell width, wiring density, wiring length, diffusion contour roughness, and misalignments of common ploy gates. Our approach considers transistor pairing and transistor placement simultaneously. It can achieve a smaller number of transistor chains than the well-known bipartite approach. About 31% of the 185 cells created by it have smaller widths and no cells whose widths are larger than their handcrafted counterparts.
  • Keywords
    CMOS integrated circuits; integer programming; linear programming; transistor circuits; CMOS standard cells; bipartite approach; common ploy gates misalignments; diffusion contour roughness; integer linear programming; transistor pairing; transistor placement; wiring density; wiring length; Layout; Logic gates; Runtime; Standards; Transistors; Wires; Wiring; Transistor placement; standard cell; transistor folding; transistor pairing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
  • Conference_Location
    Grenoble
  • Print_ISBN
    978-3-9815-3704-8
  • Type

    conf

  • Filename
    7092657