DocumentCode
704106
Title
A TSV noise-aware 3-D placer
Author
Yu-Min Lee ; Chun Chen ; JiaXing Song ; Kuan-Te Pan
Author_Institution
Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear
2015
fDate
9-13 March 2015
Firstpage
1653
Lastpage
1658
Abstract
In this work, a three-dimensional partitioning-based force-directed placer is developed to minimize coupling noise between through silicon vias (TSVs) in three-dimensional integrated circuits. TSV decoupling force is introduced and determined by the TSV coupling noise to separate TSVs with strong coupling noise. The experimental results indicate that TSV coupling noise can be effectively reduced by 36.3% on average with only 6.0% wirelength overhead. Besides, the developed 3-D placer shows great performance in wirelength that is competitive to a state-of-the-art 3-D placer.
Keywords
integrated circuit design; integrated circuit noise; three-dimensional integrated circuits; TSV coupling noise; TSV decoupling force; TSV noise-aware 3D placer; three-dimensional integrated circuits; three-dimensional partitioning-based force-directed placer; through silicon vias; wirelength overhead; Couplings; Force; Law; Noise; Runtime; Through-silicon vias;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location
Grenoble
Print_ISBN
978-3-9815-3704-8
Type
conf
Filename
7092658
Link To Document