• DocumentCode
    704106
  • Title

    A TSV noise-aware 3-D placer

  • Author

    Yu-Min Lee ; Chun Chen ; JiaXing Song ; Kuan-Te Pan

  • Author_Institution
    Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2015
  • fDate
    9-13 March 2015
  • Firstpage
    1653
  • Lastpage
    1658
  • Abstract
    In this work, a three-dimensional partitioning-based force-directed placer is developed to minimize coupling noise between through silicon vias (TSVs) in three-dimensional integrated circuits. TSV decoupling force is introduced and determined by the TSV coupling noise to separate TSVs with strong coupling noise. The experimental results indicate that TSV coupling noise can be effectively reduced by 36.3% on average with only 6.0% wirelength overhead. Besides, the developed 3-D placer shows great performance in wirelength that is competitive to a state-of-the-art 3-D placer.
  • Keywords
    integrated circuit design; integrated circuit noise; three-dimensional integrated circuits; TSV coupling noise; TSV decoupling force; TSV noise-aware 3D placer; three-dimensional integrated circuits; three-dimensional partitioning-based force-directed placer; through silicon vias; wirelength overhead; Couplings; Force; Law; Noise; Runtime; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
  • Conference_Location
    Grenoble
  • Print_ISBN
    978-3-9815-3704-8
  • Type

    conf

  • Filename
    7092658