DocumentCode :
704563
Title :
A Study of Differential Signaling: Stable and Accurate Mixed-Mode Conversion and Extraction of Differential S-Parameters
Author :
Hung Tran ; Barannyk, Lyudmyla ; Elshabini, Aicha ; Barlow, Fred
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Idaho, Moscow, ID, USA
fYear :
2015
fDate :
20-20 March 2015
Firstpage :
1
Lastpage :
4
Abstract :
Low voltage differential signaling (LVDS) in high-speed digital systems is utilized to effectively reduce EMI and improve signal quality. Mixed-mode S-parameters are a more general way to characterize a differential network. Therefore, an accurate extraction of mixed-mode S-parameters from single-ended S- parameters is critical for Signal and Power Integrity co-simulation where SSN is generated mainly by high-frequency interconnects. The standard conversion between mixed-mode and single-ended S-parameters involves inversion of a transformation matrix. If there is no coupling, this transformation matrix is orthogonal and numerical inversion can be done accurately. In the presence of coupling, the transformation matrix depends on S-parameters and may become ill-conditioned, i.e. has high condition number, for some values of physical parameters resulting in unstable inversion of the transformation matrix and leading to highly inaccurate converted mixed-mode S-parameters. To analyze the possibility of ill-conditioning, we consider two cases: broadside coupled striplines and coupled microstrip pairs. We find that in both cases when two transmission lines are strongly coupled, the condition number becomes very large. In this case, regularized methods from the theory of ill-posed problems should be used, for example, the truncated SVD method, to obtain accurate mixed-mode S- parameters.
Keywords :
S-parameters; microstrip circuits; broadside coupled striplines; coupled microstrip pairs; differential S-parameters extraction; differential signaling; mixed-mode conversion; numerical inversion; signal and power integrity co-simulation; single-ended S-parameters; transformation matrix; Conductors; Couplings; Microstrip; Scattering parameters; Stripline; Transmission line matrix methods; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics and Electron Devices (WMED), 2015 IEEE Workshop on
Conference_Location :
Boise, ID
ISSN :
1947-3834
Print_ISBN :
978-1-4799-7644-7
Type :
conf
DOI :
10.1109/WMED.2015.7093953
Filename :
7093953
Link To Document :
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