• DocumentCode
    704639
  • Title

    A novel power gating technique for 3-bit flash analog to digital converter

  • Author

    Pathak, Anshul ; Akashe, Shyam

  • Author_Institution
    Inst. of Technol. & Manage., Electron. & Commun., Gwalior, India
  • fYear
    2015
  • fDate
    19-20 Feb. 2015
  • Firstpage
    897
  • Lastpage
    901
  • Abstract
    In CMOS technology, performance degradation of power is one of the foremost questions at daily vitality. In this circuit, power dissipation is increasing exponentially constantly with technology scaling down. The analog to digital converters (ADCs) are the vital branch of signal processing and communication system. In digital region power consumption and low voltage develop into wide component is difficult for conniving high speed devices and converters. In this paper we have presented a complete investigation of 3 bits flash ADC circuit by using low leakage stacked power gating technique and diode based stacked power gating technique. These techniques are reduces the leakage current and average power in standby mode effectively. In this circuit, with the stacked power gating technique, leakage current and average power is reduced is by up to 77% and 99% respectively. Diode based stacked power gating technique can be identified as the most effective technique. With this technique, leakage current is 1.241 nA at 0.7 V and average power is 3.49 nW at 0.7 V. To evaluate of power gating techniques, the simulation has been performed using cadence virtuoso tool at assorted power supply by 45nm technology.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; leakage currents; power consumption; ADC circuit; CMOS technology; communication system; complementary metal oxide semiconductor technology; current 1.241 nA; digital region power consumption; flash analog to digital converter; leakage current reduction; performance degradation; power 3.49 nW; power dissipation; power gating technique; signal processing; size 45 nm; voltage 0.7 V; word length 3 bit; Analog-digital conversion; CMOS integrated circuits; Leakage currents; Noise; Switching circuits; Transistors; Very large scale integration; average power; flash ADC; leakage current; stacked power gating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing and Integrated Networks (SPIN), 2015 2nd International Conference on
  • Conference_Location
    Noida
  • Print_ISBN
    978-1-4799-5990-7
  • Type

    conf

  • DOI
    10.1109/SPIN.2015.7095298
  • Filename
    7095298