• DocumentCode
    704654
  • Title

    An efficient design technique for low power dynamic feedthrough logic with enhanced performance for wide fan-in gates

  • Author

    Dev, Arjun ; Sharma, R.K.

  • Author_Institution
    Sch. of VLSI & Embedded Syst. Design, Nat. Inst. of Technol. Kurukshetra, Kurukshetra, India
  • fYear
    2015
  • fDate
    19-20 Feb. 2015
  • Firstpage
    908
  • Lastpage
    912
  • Abstract
    This paper presents a new approach to high performance and low power circuit for wide fan-in gates using a new CMOS logic known as feedthrough logic (FTL). Feedthrough logic can improve the performance by partial evaluation in its computational block before getting a valid input. The FTL is more suited for those circuits which consists of a critical path of large cascaded inverting gates. FTL based circuits can perform better in both high fan-out and high frequency operations due to both dynamic power consumption and lower delay at the cost of area. The proposed circuit achieves a reduction in the average power. The comparison analysis has been carried out by simulating the logic circuit by 180 nm technology. The proposed modified FTL reduces total power consumption up to 13.25% in wide fan-in NAND gates and 99.9% in wide fan-in NOR gates. This model works more effectively in the case of NOR gates but creates more delay as compared to other proposed FTL models.
  • Keywords
    CMOS logic circuits; circuit simulation; delay circuits; integrated circuit design; logic gates; low-power electronics; CMOS logic; delay; dynamic power consumption; logic circuit simulation; low power circuit; low power dynamic feedthrough logic; size 180 nm; wide fan-in NAND gates; wide fan-in NOR gates; Clocks; Delays; Integrated circuit modeling; Logic gates; MOSFET; Power dissipation; Feedthrogh logic (FTL); dynamic CMOS logic; high performane; low power; wide fan-in gates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing and Integrated Networks (SPIN), 2015 2nd International Conference on
  • Conference_Location
    Noida
  • Print_ISBN
    978-1-4799-5990-7
  • Type

    conf

  • DOI
    10.1109/SPIN.2015.7095316
  • Filename
    7095316