Title :
Automatic modulation classification using S-transform based features
Author :
Satija, Udit ; Mohanty, Madhusmita ; Ramkumar, Barathram
Author_Institution :
Sch. of Electr. Sci., Indian Inst. of Techonology Bhubaneswar, Bhubaneswar, India
Abstract :
Automatic Modulation Classification plays a significant role in Cognitive Radio to identify the modulation format of the primary user. In this paper, we present the Stockwell transform (S-transform) based features extraction for classification of different digital modulation schemes using different classifiers such as Neural Network (NN), Support Vector Machine (SVM), Linear Discriminant Analysis (LDA), Naive Bayes (NB), k-Nearest Neighbor (k-NN). The S - transform provides time-frequency or spatial-frequency localization of a signal. This property of S-transform gives good discriminant features for different modulation schemes. Two simple features i.e., energy and entropy are used for classification. Different modulation schemes i.e., BPSK, QPSK, FSK and MSK are used for classification. The results are compared with wavelet transform based features using probability of correct classification, performance matrix including classification accuracy and computational complexity (time) for SNR range varying from 0 to 20 dB. Based upon the results, we found that S-transform based features outperform wavelet transform based features with better classification accuracy and less computational complexity.
Keywords :
Bayes methods; cognitive radio; computational complexity; entropy; feature extraction; frequency shift keying; matrix algebra; minimum shift keying; neural nets; probability; quadrature phase shift keying; signal classification; support vector machines; wavelet transforms; BPSK; FSK; LDA; MSK; NB; NN; QPSK; S-transform; SNR range; SVM; Stockwell transform; automatic modulation classification; binary phase shift keying; classification accuracy; cognitive radio; computational complexity; digital modulation scheme; entropy; feature extraction; frequency shift keying; k-NN; k-nearest neighbor; linear discriminant analysis; minimum shift keying; naive Bayes; neural network; performance matrix; probability; quadrature phase shift keying; signal-noise ratio; spatial-frequency localization; support vector machine; time-frequency localization; wavelet transform; Binary phase shift keying; Feature extraction; Frequency shift keying; Time-frequency analysis; Wavelet transforms;
Conference_Titel :
Signal Processing and Integrated Networks (SPIN), 2015 2nd International Conference on
Conference_Location :
Noida
Print_ISBN :
978-1-4799-5990-7
DOI :
10.1109/SPIN.2015.7095322